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Optical characterization of semiconductors : infrared, Raman, and photoluminescence spectroscopy /

Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Perkowitz, S.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London ; San Diego : Academic Press, �1993.
Colección:Techniques of physics ; 14.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 a 4500
001 SCIDIR_ocn747304502
003 OCoLC
005 20231117044617.0
006 m o d
007 cr bn||||||abp
007 cr bn||||||ada
008 110819s1993 enka ob 001 0 eng d
040 |a OCLCE  |b eng  |e pn  |c OCLCE  |d OPELS  |d E7B  |d OCLCF  |d OCLCQ  |d N$T  |d YDXCP  |d UKDOC  |d UIU  |d OCLCQ  |d LEAUB  |d OCLCQ  |d LUN  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCO 
019 |a 762214385  |a 844940460 
020 |a 9780080984278  |q (electronic bk.) 
020 |a 0080984274  |q (electronic bk.) 
020 |z 0125507704 
020 |z 9780125507707  |q (acid-free paper) 
035 |a (OCoLC)747304502  |z (OCoLC)762214385  |z (OCoLC)844940460 
042 |a dlr 
050 4 |a TK7871.85  |b .P426 1993 
072 7 |a TEC  |x 008090  |2 bisacsh 
072 7 |a TEC  |x 008100  |2 bisacsh 
082 0 4 |a 621.3815/2/0287  |2 20 
084 |a PHY 685f  |2 stub 
084 |a PHY 770f  |2 stub 
100 1 |a Perkowitz, S. 
245 1 0 |a Optical characterization of semiconductors :  |b infrared, Raman, and photoluminescence spectroscopy /  |c Sidney Perkowitz. 
260 |a London ;  |a San Diego :  |b Academic Press,  |c �1993. 
300 |a 1 online resource (x, 220 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Techniques of physics ;  |v 14 
504 |a Includes bibliographical references (pages 207-215) and index. 
505 2 |a 1. Introduction -- 2. Optical Theory for Semiconductor Characterization -- 3. Optical Physics of Semiconductors -- 4. Measurement Methods -- 5. Case Studies: Photoluminescence Characterization -- 6. Case Studies: Raman Characterization -- 7. Case Studies: Infrared Characterization -- 8. Summary and Future Trends. 
520 |a Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors. 
520 8 |a There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering. 
520 8 |a Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique. 
520 8 |a Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods. 
520 8 |a Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience. 
520 8 |a For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time. 
506 |3 Use copy  |f Restrictions unspecified  |2 star  |5 MiAaHDL 
533 |a Electronic reproduction.  |b [Place of publication not identified] :  |c HathiTrust Digital Library,  |d 2011.  |5 MiAaHDL 
538 |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.  |u http://purl.oclc.org/DLF/benchrepro0212  |5 MiAaHDL 
583 1 |a digitized  |c 2011  |h HathiTrust Digital Library  |l committed to preserve  |2 pda  |5 MiAaHDL 
588 0 |a Print version record. 
650 0 |a Semiconductors  |x Testing  |x Optical methods. 
650 6 |a Semi-conducteurs  |x Essais  |x M�ethodes optiques.  |0 (CaQQLa)000265313 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Semiconductors.  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Solid State.  |2 bisacsh 
650 7 |a Semiconductors  |x Testing  |x Optical methods  |2 fast  |0 (OCoLC)fst01112263 
650 7 |a Halbleiter  |2 gnd  |0 (DE-588)4022993-2 
650 7 |a Spektroskopie  |2 gnd  |0 (DE-588)4056138-0 
650 7 |a Spectroscopie infrarouge.  |2 ram 
650 7 |a Spectroscopie Raman.  |2 ram 
650 7 |a Photoluminescence.  |2 ram 
650 7 |a Semiconducteurs  |x Propri�et�es optiques.  |2 ram 
653 0 |a Semiconductors  |a Optical properties 
776 0 8 |i Print version:  |w (DLC) 94129981  |w (OCoLC)29540358 
830 0 |a Techniques of physics ;  |v 14. 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780125507707  |z Texto completo