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Optical characterization of semiconductors : infrared, Raman, and photoluminescence spectroscopy /

Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Perkowitz, S.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London ; San Diego : Academic Press, �1993.
Colección:Techniques of physics ; 14.
Temas:
Acceso en línea:Texto completo