Optical characterization of semiconductors : infrared, Raman, and photoluminescence spectroscopy /

Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Perkowitz, S.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London ; San Diego : Academic Press, �1993.
Colección:Techniques of physics ; 14.
Temas:
Semiconductors > Testing > Optical methods.
Semi-conducteurs > Essais > M�ethodes optiques.
TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.
TECHNOLOGY & ENGINEERING > Electronics > Solid State.
Semiconductors > Testing > Optical methods
Halbleiter
Spektroskopie
Spectroscopie infrarouge.
Spectroscopie Raman.
Photoluminescence.
Semiconducteurs > Propri�et�es optiques.
Semiconductors > Optical properties
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1. Introduction
  • 2. Optical Theory for Semiconductor Characterization
  • 3. Optical Physics of Semiconductors
  • 4. Measurement Methods
  • 5. Case Studies: Photoluminescence Characterization
  • 6. Case Studies: Raman Characterization
  • 7. Case Studies: Infrared Characterization
  • 8. Summary and Future Trends.

Ejemplares similares