Electronics reliability and measurement technology : nondestructive evaluation /

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This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Heyman, Joseph S.
Format: Electronic eBook
Language:Inglés
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., �1988.
Subjects:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
Circuits int�egr�es > Fiabilit�e > Congr�es.
Contr�ole non destructif > Congr�es.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Integrated circuits > Reliability
Integrated circuits > Testing
Nondestructive testing
Elektronik
Elektronische Schaltung
Kongress
Zuverl�assigkeit
proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congr�es.
Hampton (Va., 1986)
Online Access:Texto completo
Description
Summary:This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Item Description:"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii
Physical Description:1 online resource (xii, 128 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:1591240514
9781591240518
9780815511717
081551171X
9780815516996
0815516991
9780080944685
008094468X
1282002295
9781282002296
9786612002298
6612002298
0815517009
9780815517009

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