Electronics reliability and measurement technology : nondestructive evaluation /

Afficher d'autres versions (1)

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Détails bibliographiques
Cote:Libro Electrónico
Autres auteurs: Heyman, Joseph S.
Format: Électronique eBook
Langue:Inglés
Publié: Park Ridge, N.J., U.S.A. : Noyes Data Corp., �1988.
Sujets:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
Circuits int�egr�es > Fiabilit�e > Congr�es.
Contr�ole non destructif > Congr�es.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Integrated circuits > Reliability
Integrated circuits > Testing
Nondestructive testing
Elektronik
Elektronische Schaltung
Kongress
Zuverl�assigkeit
proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congr�es.
Hampton (Va., 1986)
Accès en ligne:Texto completo

Internet

Texto completo

Items no disponibles

Informations d'exemplaires de

Documents similaires