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Machine learning for high-risk applications : approaches to responsible AI /

The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before...

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Détails bibliographiques
Cote:Libro Electrónico
Auteurs principaux: Hall, Patrick (Auteur), Curtis, James (Auteur), Pandey, Parul (Auteur)
Autres auteurs: Sudjianto, Agus (writer of foreword.)
Format: Électronique eBook
Langue:Inglés
Publié: Sebastopol, CA : O'Reilly Media, Inc., 2023.
Édition:[First edition].
Sujets:
Accès en ligne:Texto completo (Requiere registro previo con correo institucional)