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Machine learning for high-risk applications : approaches to responsible AI /

The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Hall, Patrick (Author), Curtis, James (Author), Pandey, Parul (Author)
Other Authors: Sudjianto, Agus (writer of foreword.)
Format: Electronic eBook
Language:Inglés
Published: Sebastopol, CA : O'Reilly Media, Inc., 2023.
Edition:[First edition].
Subjects:
Online Access:Texto completo (Requiere registro previo con correo institucional)