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Characterization in compound semiconductor processing /

This volume has been written to aid scientists and engineers working with compound semiconductor materials and devices in the selection and application of various analytical techniques. It highlights analytical problems that occur at all stages of materials or device processing (substrate preparatio...

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Détails bibliographiques
Cote:Libro Electrónico
Autres auteurs: Strausser, Yale, McGuire, G. E.
Format: Électronique eBook
Langue:Inglés
Publié: New York : Momentum Press, 1995.
Collection:Materials characterization series.
Sujets:
Accès en ligne:Texto completo