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Characterization in compound semiconductor processing /

This volume has been written to aid scientists and engineers working with compound semiconductor materials and devices in the selection and application of various analytical techniques. It highlights analytical problems that occur at all stages of materials or device processing (substrate preparatio...

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Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Strausser, Yale, McGuire, G. E.
Format: Electronic eBook
Language:Inglés
Published: New York : Momentum Press, 1995.
Series:Materials characterization series.
Subjects:
Online Access:Texto completo