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VLSI reliability /

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.

Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Sabnis, Anant G.
Format: Électronique eBook
Langue:Inglés
Publié: San Diego : Academic Press, 1990.
Collection:VLSI electronics ; v. 22.
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