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New approaches to image processing based failure analysis of nano-scale ULSI devices /
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Oxford :
William Andrew,
2014.
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| Colección: | Micro & nano technologies.
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| Temas: | |
| Acceso en línea: | Texto completo |