New approaches to image processing based failure analysis of nano-scale ULSI devices /

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Zalevsky, Zeev
Otros Autores: Livshits, Pavel, Gur, Eran
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Oxford : William Andrew, 2014.
Colección:Micro & nano technologies.
Temas:
Integrated circuits > Ultra large scale integration > Testing.
Nanoelectronics.
Microelectronics.
Miniaturization
Nano�electronique.
Micro�electronique.
microelectronics.
TECHNOLOGY & ENGINEERING > Mechanical.
Integrated circuits > Ultra large scale integration > Testing
Microelectronics
Nanoelectronics
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