Digital circuit testing : a guide to DFT and other techniques /

"Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of el...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Wang, Francis C.
Format: Electronic eBook
Language:Inglés
Published: San Diego : Academic Press, �1991.
Subjects:
Digital integrated circuits > Testing.
Circuits int�egr�es num�eriques > Essais.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
Digitalschaltung
Testen
Circuits int�egr�es num�eriques.
Test circuit int�egr�e.
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