Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.

Show other versions (1)

Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture...

Full description

Bibliographic Details
Call Number:Libro Electrónico
Main Author: Klapetek, Petr
Format: Electronic eBook
Language:Inglés
Published: Burlington : Elsevier Science, 2012.
Series:Micro & nano technologies.
Subjects:
Scanning probe microscopy > Data processing.
Qualitative research > Data processing.
Scanning probe microscopy.
Microscopie �a sonde �a balayage > Informatique.
Recherche qualitative > Informatique.
Microscopie �a sonde �a balayage.
SCIENCE > Nanoscience.
TECHNOLOGY & ENGINEERING > Nanotechnology & MEMS.
Scanning probe microscopy
Scanning probe microscopy > Data processing
Online Access:Texto completo
Table of Contents:
  • Motivation
  • Instrumentation Principles
  • Data Models
  • Basic Data Processing*
  • Dimensional Measurements*
  • Force and Mechanical Properties
  • Friction and Lateral Forces
  • Electrostatic Fields*
  • Magnetic Fields
  • Local Current Measurements*
  • Thermal Measurements
  • Optical Measurements
  • Sample Data Files
  • Numerical Modeling Techniques.

Similar Items