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Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Burlington :
Elsevier Science,
2012.
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| Colección: | Micro & nano technologies.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Motivation
- Instrumentation Principles
- Data Models
- Basic Data Processing*
- Dimensional Measurements*
- Force and Mechanical Properties
- Friction and Lateral Forces
- Electrostatic Fields*
- Magnetic Fields
- Local Current Measurements*
- Thermal Measurements
- Optical Measurements
- Sample Data Files
- Numerical Modeling Techniques.