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Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Burlington :
Elsevier Science,
2012.
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| Colección: | Micro & nano technologies.
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| Temas: | |
| Acceso en línea: | Texto completo |