Chargement en cours…
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture...
| Cote: | Libro Electrónico |
|---|---|
| Auteur principal: | |
| Format: | Électronique eBook |
| Langue: | Inglés |
| Publié: |
Burlington :
Elsevier Science,
2012.
|
| Collection: | Micro & nano technologies.
|
| Sujets: | |
| Accès en ligne: | Texto completo |