Chargement en cours…
Optical characterization of real surfaces and films /
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverag...
| Cote: | Libro Electrónico |
|---|---|
| Autres auteurs: | |
| Format: | Électronique eBook |
| Langue: | Inglés |
| Publié: |
Boston :
Academic Press,
1994.
|
| Collection: | Physics of thin films ;
v. 19 |
| Sujets: | |
| Accès en ligne: | Texto completo |