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Computed electron micrographs and defect identification /
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam :
North-Holland Pub. Co.,
1973.
|
| Colección: | Defects in crystalline solids ;
v. 7. |
| Temas: | |
| Acceso en línea: | Texto completo Texto completo Texto completo |
MARC
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| 245 | 0 | 0 | |a Computed electron micrographs and defect identification / |c by A.K. Head, P. Humble, L.M. Clarebrough, a.o. |
| 264 | 1 | |a Amsterdam : |b North-Holland Pub. Co., |c 1973. | |
| 300 | |a 1 online resource (x, 400 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Defects in crystalline solids ; |v v. 7 | |
| 504 | |a Includes bibliographical references (pages 387-389). | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Metals |x Defects |x Data processing. | |
| 650 | 0 | |a Electron microscopy |x Data processing. | |
| 650 | 0 | |a Crystals |x Defects. | |
| 650 | 0 | |a Electrons |x Diffraction. | |
| 650 | 0 | |a Crystallography |x Data processing. | |
| 650 | 6 | |a Cristaux |x D�efauts. |0 (CaQQLa)201-0022122 | |
| 650 | 6 | |a �Electrons |x Diffraction. |0 (CaQQLa)201-0022015 | |
| 650 | 6 | |a Cristallographie |0 (CaQQLa)201-0014886 |x Informatique. |0 (CaQQLa)201-0380011 | |
| 650 | 6 | |a M�etaux |0 (CaQQLa)201-0000302 |x D�efauts |0 (CaQQLa)201-0000302 |x Informatique. |0 (CaQQLa)201-0380011 | |
| 650 | 6 | |a Microscopie �electronique |0 (CaQQLa)201-0066871 |x Informatique. |0 (CaQQLa)201-0380011 | |
| 650 | 7 | |a electron diffraction. |2 aat |0 (CStmoGRI)aat300227274 | |
| 650 | 7 | |a SCIENCE |x Physics |x Crystallography. |2 bisacsh | |
| 650 | 7 | |a Electrons |x Diffraction. |2 fast |0 (OCoLC)fst00907646 | |
| 650 | 7 | |a Crystals |x Defects. |2 fast |0 (OCoLC)fst00884675 | |
| 650 | 7 | |a Crystallography |x Data processing. |2 fast |0 (OCoLC)fst00884656 | |
| 650 | 7 | |a Electron microscopy |x Data processing. |2 fast |0 (OCoLC)fst00906684 | |
| 650 | 7 | |a Metals |x Defects |x Data processing. |2 fast |0 (OCoLC)fst01018081 | |
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| 650 | 1 | 7 | |a Elektronenmicroscopie. |2 gtt |
| 650 | 1 | 7 | |a Computersimulaties. |2 gtt |
| 700 | 1 | |a Head, A. K. | |
| 776 | 0 | 8 | |i Print version: |t Computed electron micrographs and defect identification. |d Amsterdam, North-Holland Pub. Co., 1973 |w (DLC) 72093092 |w (OCoLC)887441 |
| 830 | 0 | |a Defects in crystalline solids ; |v v. 7. | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780720417579 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/00703230 |z Texto completo |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/bookseries/00703230/7 |z Texto completo |