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Computed electron micrographs and defect identification /

Bibliographic Details
Call Number:	Libro Electrónico
Other Authors:	Head, A. K.
Format:	Electronic eBook
Language:	Inglés
Published:	Amsterdam : North-Holland Pub. Co., 1973.
Series:	Defects in crystalline solids ; v. 7.
Subjects:	Metals > Defects > Data processing. Electron microscopy > Data processing. Crystals > Defects. Electrons > Diffraction. Crystallography > Data processing. Cristaux > D�efauts. �Electrons > Diffraction. Cristallographie > Informatique. M�etaux > D�efauts > Informatique. Microscopie �electronique > Informatique. electron diffraction. SCIENCE > Physics > Crystallography. Metall Mikrostruktur Roosterfouten. Vastestoffysica. Elektronendiffractie. Elektronenmicroscopie. Computersimulaties.
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