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Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 /

The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D...

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Détails bibliographiques
Cote:Libro Electrónico
Autres auteurs: Gelsema, Edzard S., 1937-, Kanal, Laveen N.
Format: Électronique eBook
Langue:Inglés
Publié: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
Sujets:
Accès en ligne:Texto completo
Description
Résumé:The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D reconstruction methods, and application oriented papers. Part II deals with aspects of statistical pattern recognition, the problem of population classification, and topics common to both pattern recognition and artificial intelligence.
Description matérielle:1 online resource (xvi, 571 pages) : illustrations
Bibliographie:Includes bibliographical references and indexes.
ISBN:0444599223
9780444599223