Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 /

The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Gelsema, Edzard S., 1937-, Kanal, Laveen N.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
Temas:
Pattern perception > Congresses.
Image processing > Congresses.
Depth perception > Congresses.
Depth perception.
Pattern recognition systems.
Depth Perception
Pattern Recognition, Automated
Perception des structures > Congr�es.
Traitement d'images > Congr�es.
Perception de la profondeur > Congr�es.
Perception de la profondeur.
Reconnaissance des formes (Informatique)
Pattern recognition systems
Depth perception
Image processing
Pattern perception
Patroonherkenning.
Informatietechnieken.
Computermethoden.
Pattern recognition
Congress
proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congr�es.
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