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Pattern recognition in practice II : proceedings of an international workshop held in Amsterdam, June 19-21, 1985 /

The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D...

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Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Gelsema, Edzard S., 1937-, Kanal, Laveen N.
Format: Electronic eBook
Language:Inglés
Published: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1986.
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