Cargando…

Silicon molecular beam epitaxy : proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989 /

This two-volume work covers recent developments in the single crystal growth, by molecular beam epitaxy, of materials compatible with silicon, their physical characterization, and device application. Papers are included on surface physics and related vacuum synthesis techniques such as solid phase e...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores Corporativos: International Symposium on Silicon Molecular Beam Epitaxy Strasbourg, France, European Materials Research Society
Otros Autores: Kasper, Erich, Parker, E. H. C.
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Amsterdam ; New York : New York, NY, USA : North-Holland ; Sole distributors for the USA and Canada, Elsevier Science Pub. Co., 1989-<1990>
Colección:European Materials Research Society symposia proceedings ; v. 10.
Temas:
Acceso en línea:Texto completo

MARC

LEADER 00000cam a2200000 a 4500
001 SCIDIR_ocn607719565
003 OCoLC
005 20231117033046.0
006 m o d
007 cr un||||a|a||
008 100417m19899999ne a ob 101 0 eng d
040 |a OCLCE  |b eng  |e pn  |c OCLCE  |d OCLCQ  |d OPELS  |d OCLCO  |d OCLCQ  |d OCLCF  |d UIU  |d OCLCO  |d YDXCP  |d OCL  |d OCLCO  |d NOC  |d OCLCQ  |d LEAUB  |d OCLCQ  |d COM  |d OCLCO  |d OCLCQ  |d OCLCO 
019 |a 644027550  |a 1086500146 
020 |z 0444886206 
020 |z 9780444886200 
035 |a (OCoLC)607719565  |z (OCoLC)644027550  |z (OCoLC)1086500146 
042 |a dlr 
050 4 |a QC611.6.M64  |b I58 1989 
082 0 4 |a 621.381/52  |2 20 
111 2 |a International Symposium on Silicon Molecular Beam Epitaxy  |n (3rd :  |d 1989 :  |c Strasbourg, France) 
245 1 0 |a Silicon molecular beam epitaxy :  |b proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989 /  |c edited by E. Kasper, E.H.C. Parker. 
260 |a Amsterdam ;  |a New York :  |b North-Holland ;  |a New York, NY, USA :  |b Sole distributors for the USA and Canada, Elsevier Science Pub. Co.,  |c 1989-<1990> 
300 |a 1 online resource (volumes <1-2>) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a European Materials Research Society symposia proceedings ;  |v v. 10 
504 |a Includes bibliographical references and indexes. 
588 0 |a Print version record. 
506 |3 Use copy  |f Restrictions unspecified  |2 star  |5 MiAaHDL 
533 |a Electronic reproduction.  |b [Place of publication not identified] :  |c HathiTrust Digital Library,  |d 2010.  |5 MiAaHDL 
538 |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.  |u http://purl.oclc.org/DLF/benchrepro0212  |5 MiAaHDL 
583 1 |a digitized  |c 2010  |h HathiTrust Digital Library  |l committed to preserve  |2 pda  |5 MiAaHDL 
520 |a This two-volume work covers recent developments in the single crystal growth, by molecular beam epitaxy, of materials compatible with silicon, their physical characterization, and device application. Papers are included on surface physics and related vacuum synthesis techniques such as solid phase epitaxy and ion beam epitaxy. A selection of contents: Volume I. SiGe Superlattices. SiGe strained layer superlattices (G. Abstreiter). Optical properties of strained GeSi superlattices grown on (001)Ge (T.P. Pearsall et al.). Growth and characterization of SiGe atomic layer superlattices (J.-M. Baribeau et al.). Optical properties of perfect and imperfect SiGe superlattices (K.B. Wong et al.). Confined phonons in stained short-period (001) Si/Ge superlattices (W. Bacsa et al.). Calculation of energies and Raman intensities of confined phonons in SiGe strained layer superlattices (J. White et al.). Rippled surface topography observed on silicon molecular beam epitaxial and vapour phase epitaxial layers (A.J. Pidduck et al.). The 698 meV optical band in MBE silicon (N. de Mello et al.). Silicon Growth Doping. Dopant incorporation kinetics and abrupt profiles during silicon molecular beam epitaxy (J.-E. Sundgren et al.). Influence of substrate orientation on surface segregation process in silicon-MBE (K. Nakagawa et al.). Growth and transport properties of Si<INF>m</INF>Sb<INF>1</INF> (H. Jorke, H. Kibbel). Author Index. Volume. II. In-situ electron microscope studies of lattice mismatch relaxation in Ge<INF>x</INF>Si<INF>1-x</INF>/Si heterostructures (R. Hull et al.). Heterogeneous nucleation sources in molecular beam epitaxy-grown Ge<INF>x</INF>Si<INF>1-x</INF>/Si strained layer superlattices (D.D. Perovic et al.). Silicon Growth. Hydrogen-terminated silicon substrates for low-temperature molecular beam epitaxy (P.J. Grunthaner et al.). Interaction of structure with kinetics in Si(001) homoepitaxy (S. Clarke et al.). Surface step structure of a lens-shaped Si(001) vicinal substrate (K. Sakamoto et al.). Photoluminescence characterization of molecular beam epitaxial silicon (E.C. Lightowlers et al.). Doping. Boron doping using compound source (T. Tatsumi). P-type delta doping in silicon MBE (N.L. Mattey et al.). Modulation-doped superlattices with delta layers in silicon (H.P. Zeindell et al.). Steep doping profiles obtained by low-energy implantation of arsenic in silicon MBE layers (N. Djebbar et al.). Alternative Growth Methods. Limited reaction processing: growth of Si/Si<INF>1-x</INF>Ge<INF>x</INF> for heterojunction bipolar transistor applications (J.L. Hoyt et al.). High gain SiGe heterojunction bipolar transistors grown by rapid thermal chemical vapor deposition (M.L. Green et al.). Epitaxial growth of single-crystalline Si<INF>1-x</INF>Ge<INF>x</INF> on Si(100) by ion beam sputter deposition (F. Meyer et al.). Phosphorus gas doping in gas source silicon-MBE (H. Hirayama, T. Tatsumi). Devices. Narrow band gap base heterojunction bipolar transistors using SiGe alloys (S.S. Iyer et al.). Silicon-based millimeter-wave integrated circuits (J-F. Luy). Performance and processing line integration of a silicon molecular beam epitaxy system (A.A. van Gorkum et al.). Silicides. Reflection high energy electron diffraction study of Cosi2/Si multilayer structures (Q. Ye at al.). Epitaxy of metal silicides (H. von Kanel et al.). Epitaxial growth of ErSi<INF>2</INF> on (111)si (D. Loretto et al.). Other Material Systems. Oxygen-doped and nitrogen-doped silicon films prepared by molecular beam epitaxy (M. Tabe et al.). Properties of diamond structure SnGe films grown by molecular beam epitaxy (A. Harwit et al.). Si-MBE: Prospects and Challenges. Prospects and challenges for molecular beam epitaxy in silicon very-large-scale integration (W. Eccleston). Prospects and challenges for SiGe strained-layer epitaxy (T.P. Pearsall). Author Index. 
650 0 |a Molecular beam epitaxy  |v Congresses. 
650 0 |a Silicon crystals  |v Congresses. 
650 0 |a Crystal growth  |v Congresses. 
650 0 |a Superlattices as materials  |v Congresses. 
650 0 |a Microstructure  |v Congresses. 
650 6 |a &#xFFFD;Epitaxie par jets mol&#xFFFD;eculaires  |0 (CaQQLa)201-0282349  |v Congr&#xFFFD;es.  |0 (CaQQLa)201-0378219 
650 6 |a Silicium cristallis&#xFFFD;e  |0 (CaQQLa)201-0156695  |v Congr&#xFFFD;es.  |0 (CaQQLa)201-0378219 
650 6 |a Cristaux  |0 (CaQQLa)201-0039459  |x Croissance  |0 (CaQQLa)201-0039459  |v Congr&#xFFFD;es.  |0 (CaQQLa)201-0378219 
650 6 |a Superr&#xFFFD;eseaux  |0 (CaQQLa)201-0202692  |v Congr&#xFFFD;es.  |0 (CaQQLa)201-0378219 
650 6 |a Microstructure (Physique)  |0 (CaQQLa)201-0017523  |v Congr&#xFFFD;es.  |0 (CaQQLa)201-0378219 
650 7 |a Crystal growth  |2 fast  |0 (OCoLC)fst00884619 
650 7 |a Microstructure  |2 fast  |0 (OCoLC)fst01020118 
650 7 |a Molecular beam epitaxy  |2 fast  |0 (OCoLC)fst01024729 
650 7 |a Silicon crystals  |2 fast  |0 (OCoLC)fst01118668 
650 7 |a Superlattices as materials  |2 fast  |0 (OCoLC)fst01138901 
655 2 |a Congress  |0 (DNLM)D016423 
655 7 |a proceedings (reports)  |2 aat  |0 (CStmoGRI)aatgf300027316 
655 7 |a Conference papers and proceedings  |2 fast  |0 (OCoLC)fst01423772 
655 7 |a Conference papers and proceedings.  |2 lcgft 
655 7 |a Actes de congr&#xFFFD;es.  |2 rvmgf  |0 (CaQQLa)RVMGF-000001049 
700 1 |a Kasper, Erich. 
700 1 |a Parker, E. H. C. 
710 2 |a European Materials Research Society. 
730 0 |a Thin solid films. 
776 0 8 |i Print version:  |a International Symposium on Silicon Molecular Beam Epitaxy (3rd : 1989 : Strasbourg, France).  |t Silicon molecular beam epitaxy.  |d Amsterdam ; New York : North-Holland ; New York, NY, USA : Sole distributors for the USA and Canada, Elsevier Science Pub. Co., 1989-<1990>  |w (DLC) 90162717  |w (OCoLC)21871495 
830 0 |a European Materials Research Society symposia proceedings ;  |v v. 10. 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780444886200  |z Texto completo