VLSI test principles and architectures : design for testability /

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

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Détails bibliographiques
Cote:Libro Electrónico
Autres auteurs: Wang, Laung-Terng (Éditeur intellectuel), Wu, Cheng-Wen, EE Ph. D. (Éditeur intellectuel), Wen, Xiaoqing (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Collection:Morgan Kaufmann series in systems on silicon.
Sujets:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Integrated circuits > Very large scale integration > Design and construction.
Circuits int�egr�es �a tr�es grande �echelle > Essais.
Circuits int�egr�es �a tr�es grande �echelle > Conception et construction.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > VLSI & ULSI.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Logic.
COMPUTERS > Logic Design.
Integrated circuits > Very large scale integration > Design and construction
Integrated circuits > Very large scale integration > Design
Integrated circuits > Very large scale integration > Testing
Testen
VLSI
Circuitos integrados vlsi.
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