VLSI test principles and architectures : design for testability /

Show other versions (4)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

Full description

Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Wang, Laung-Terng (Editor), Wu, Cheng-Wen, EE Ph. D. (Editor), Wen, Xiaoqing (Editor)
Format: Electronic eBook
Language:Inglés
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Integrated circuits > Very large scale integration > Design and construction.
Circuits int�egr�es �a tr�es grande �echelle > Essais.
Circuits int�egr�es �a tr�es grande �echelle > Conception et construction.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > VLSI & ULSI.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Logic.
COMPUTERS > Logic Design.
Integrated circuits > Very large scale integration > Design and construction
Integrated circuits > Very large scale integration > Design
Integrated circuits > Very large scale integration > Testing
Testen
VLSI
Circuitos integrados vlsi.
Online Access:Texto completo

Internet

Texto completo

Items no disponibles

Holdings details from

Similar Items