APA (7th ed.) Citation

Heyman, J. S. (1988). Electronics reliability and measurement technology: Nondestructive evaluation. Noyes Data Corp..

Chicago Style (17th ed.) Citation

Heyman, Joseph S. Electronics Reliability and Measurement Technology: Nondestructive Evaluation. Park Ridge, N.J., U.S.A.: Noyes Data Corp., 1988.

MLA (8th ed.) Citation

Heyman, Joseph S. Electronics Reliability and Measurement Technology: Nondestructive Evaluation. Noyes Data Corp., 1988.