Cita APA (7a ed.)

Heyman, J. S. (1988). Electronics reliability and measurement technology: Nondestructive evaluation. Noyes Data Corp..

Cita Chicago Style (17a ed.)

Heyman, Joseph S. Electronics Reliability and Measurement Technology: Nondestructive Evaluation. Park Ridge, N.J., U.S.A.: Noyes Data Corp., 1988.

Cita MLA (8a ed.)

Heyman, Joseph S. Electronics Reliability and Measurement Technology: Nondestructive Evaluation. Noyes Data Corp., 1988.