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Reliability and failure of electronic materials and devices /

"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Ohring, Milton, 1936-
Other Authors: Kasprzak, Lucian
Format: Electronic eBook
Language:Inglés
Published: Amsterdam ; Boston : Academic Press is an imprint of Elsevier, 2014.
Edition:Second edition.
Subjects:
Online Access:Texto completo (Requiere registro previo con correo institucional)