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Fundamental principles of engineering nanometrology /

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Leach, R. K. (Author)
Format: Electronic eBook
Language:Inglés
Published: Oxford, OX : Elsevier, William Andrew, 2014.
Edition:Second edition.
Series:Micro & nano technologies.
Subjects:
Online Access:Texto completo (Requiere registro previo con correo institucional)