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Fundamental principles of engineering nanometrology /

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rig...

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Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Leach, R. K. (Auteur)
Format: Électronique eBook
Langue:Inglés
Publié: Oxford, OX : Elsevier, William Andrew, 2014.
Édition:Second edition.
Collection:Micro & nano technologies.
Sujets:
Accès en ligne:Texto completo (Requiere registro previo con correo institucional)