Semiconductor x-ray detectors /
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...
Call Number: | Libro Electrónico |
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Main Authors: | , |
Format: | Electronic eBook |
Language: | Inglés |
Published: |
Boca Raton, FL :
CRC Press,
[2014]
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Series: | Sensors series.
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Subjects: | |
Online Access: | Texto completo (Requiere registro previo con correo institucional) |