Digital logic testing and simulation /

The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random de...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Miczo, Alexander
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hoboken, NJ : Wiley-Interscience, ©2003.
Edición:2nd ed.
Temas:
Digital electronics > Testing.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Circuit theory and design / vlsi / ulsi > Computer engineering.
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)
Tabla de Contenidos:
  • Introduction
  • Simulation
  • Fault Simulation
  • Automatic Test Pattern Generation
  • Sequential Logic Test
  • Automatic Test Equipment
  • Developing a Test Strategy
  • Design-For-Testability
  • Built-In Self-Test
  • Memory Test
  • I(DDQ)
  • Behavioral Test and Verification.

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