Digital logic testing and simulation /
The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random de...
Call Number: | Libro Electrónico |
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Main Author: | |
Format: | Electronic eBook |
Language: | Inglés |
Published: |
Hoboken, NJ :
Wiley-Interscience,
©2003.
|
Edition: | 2nd ed. |
Subjects: | |
Online Access: | Texto completo (Requiere registro previo con correo institucional) |
Table of Contents:
- Introduction
- Simulation
- Fault Simulation
- Automatic Test Pattern Generation
- Sequential Logic Test
- Automatic Test Equipment
- Developing a Test Strategy
- Design-For-Testability
- Built-In Self-Test
- Memory Test
- I(DDQ)
- Behavioral Test and Verification.