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Digital logic testing and simulation /
The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random de...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, NJ :
Wiley-Interscience,
©2003.
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| Edición: | 2nd ed. |
| Temas: | |
| Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |