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Digital logic testing and simulation /
The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random de...
| Call Number: | Libro Electrónico |
|---|---|
| Main Author: | |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
Hoboken, NJ :
Wiley-Interscience,
©2003.
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| Edition: | 2nd ed. |
| Subjects: | |
| Online Access: | Texto completo (Requiere registro previo con correo institucional) |