Nanoscale CMOS VLSI circuits : design for manufacturability /

Covering the latest devices; technologies; and processes; this detailed guide offers proven methods for optimizing circuit designs to increase the yield; reliability; and manufacturability of products and mitigate defects and failure.

Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Kundu, Sandip (Auteur)
Autres auteurs: Sreedhar, Aswin, Penn, Michael, Fogarty, David E., Darnell, Matt
Format: Électronique eBook
Langue:Inglés
Publié: New York, N.Y. : McGraw-Hill Education, [2011]
Édition:First edition.
Collection:McGraw-Hill's AccessEngineering.
Sujets:
Metal oxide semiconductors, Complementary > Design and construction.
Integrated circuits > Very large scale integration > Design and construction.
Electronic books.
Accès en ligne:Texto completo
Table des matières:
  • Semiconductor manufacturing
  • Process and device variability : analysis and modeling
  • Manufacturing-aware physical design closure
  • Metrology, manufacturing defects, and defect extraction
  • Defect impact modeling and yield improvement techniques
  • Physical design and reliability
  • Design for manufacturability : tools and methodologies.

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