Characterisation and control of defects in semiconductors /

The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation s...

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Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Tuomisto, Filip (Editor)
Format: Electronic eBook
Language:Inglés
Published: Stevenage : The Institution of Engineering and Technology, 2019.
Series:Materials, circuits and devices series ; 45.
Subjects:
Ion implantation.
Magnetic resonance.
Semiconductor doping.
Semiconductors > Materials.
Silicon.
Silicon
Ions > Implantation.
Résonance magnétique.
Semi-conducteurs > Dopage.
Semi-conducteurs > Matériaux.
Silicium.
silicon.
crystal defects.
ion beam effects.
ion implantation.
luminescence.
magnetic resonance.
microscopy.
positron annihilation.
semiconductor doping.
semiconductor materials.
semiconductor defects
electrically active defects
point defect luminescence
vibrational spectroscopy
magnetic resonance methods
muons
positron annihilation spectroscopy
first principles methods
microscopy
3D atomic-scale studies
ion beam modification
ion beam analysis
channelling
silicon
elemental semiconductors
ion implantation
ion beam effects
semiconductor doping
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