Properties of porous silicon /

Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: INSPEC (Information service)
Other Authors: Canham, Leigh T.
Format: Electronic eBook
Language:Inglés
Published: London : IEE : INSPEC, ©1987.
Series:EMIS datareviews series ; no. 18.
Subjects:
Porous silicon.
Semiconductors.
Silicium poreux.
Semi-conducteurs.
semiconductor.
Porous silicon
Semiconductors
Semiconducteurs.
Optoélectronique.
Silicium.
Matériaux poreux.
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