Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra /

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This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spec...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Mikhailov, Igor F.
Other Authors: Baturin, Alexey A., Mikhailov, Anton I.
Format: Electronic eBook
Language:Inglés
Published: Newcastle-upon-Tyne : Cambridge Scholars Publisher, 2020.
Subjects:
Fluorescence spectroscopy.
X-ray spectroscopy.
X-rays > Diffraction.
Materials > Analysis.
Spectrometry, Fluorescence
Spectrometry, X-Ray Emission
X-Ray Diffraction
Spectroscopie de fluorescence.
Spectroscopie des rayons X.
Rayons X > Diffraction.
Matériaux > Analyse.
x-ray spectroscopy.
x-ray diffraction.
Online Access:Texto completo
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Analyzing materials using joint x-ray fluorescence and diffraction spectra /
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