ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California /

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Détails bibliographiques
Cote:Libro Electrónico
Collectivités auteurs: International Symposium for Testing and Failure Analysis San Jose, Calif., Electronic Device Failure Analysis Society, International Symposium for Testing and Failure Analysis/2011, ASM International
Format: Électronique Actes de congrès eBook
Langue:Inglés
Publié: Materials Park, OH : ASM International, 2011.
Sujets:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Appareils électroniques > Essais > Congrès.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic apparatus and appliances > Testing
Electronics > Materials > Testing
Testing analysis
Conference papers and proceedings
Accès en ligne:Texto completo

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