Loading…

A designer's guide to built-in self-test /

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is w...

Full description

Bibliographic Details
Call Number:Libro Electrónico
Main Author: Stroud, Charles E.
Format: Electronic eBook
Language:Inglés
Published: Boston : Kluwer Academic Publishers, ©2002.
Series:Frontiers in electronic testing.
Subjects:
Online Access:Texto completo