Noncontact Atomic Force Microscopy Volume 2 /

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Morita, Seizo (Editor ), Giessibl, Franz J. (Editor ), Wiesendanger, Roland (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Mechanics, Applied.
Nanotechnology.
Engineering.
Condensed matter.
Microsystems and MEMS.
Spectroscopy.
Engineering Mechanics.
Technology and Engineering.
Condensed Matter Physics.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Method for Precise Force Measurements
  • Force Spectroscopy on Semiconductor Surfaces
  • Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces
  • Force Field Spectroscopy in Three Dimensions
  • Principles and Applications of the qPlus Sensor
  • Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond
  • Atom Manipulation on Semiconductor Surfaces
  • Atomic Manipulation on Metal Surfaces
  • Atomic Manipulation on an Insulator Surface
  • Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
  • Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces
  • Magnetic Exchange Force Microscopy
  • First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
  • Frequency Modulation Atomic Force Microscopy in Liquids
  • Biological Applications of FM-AFM in Liquid Environment
  • High-Frequency Low Amplitude Atomic Force Microscopy
  • Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.

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