Noncontact Atomic Force Microscopy Volume 2 /

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Morita, Seizo (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland (Editor)
Format: Electronic eBook
Language:Inglés
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Series:NanoScience and Technology,
Subjects:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Mechanics, Applied.
Nanotechnology.
Engineering.
Condensed matter.
Microsystems and MEMS.
Spectroscopy.
Engineering Mechanics.
Technology and Engineering.
Condensed Matter Physics.
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