Noncontact Atomic Force Microscopy Volume 2 /

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Morita, Seizo (Editor ), Giessibl, Franz J. (Editor ), Wiesendanger, Roland (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Mechanics, Applied.
Nanotechnology.
Engineering.
Condensed matter.
Microsystems and MEMS.
Spectroscopy.
Engineering Mechanics.
Technology and Engineering.
Condensed Matter Physics.
Acceso en línea:Texto Completo

MARC

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245 1 0 |a Noncontact Atomic Force Microscopy  |h [electronic resource] :  |b Volume 2 /  |c edited by Seizo Morita, Franz J. Giessibl, Roland Wiesendanger. 
250 |a 1st ed. 2009. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2009. 
300 |a XVIII, 401 p. 105 illus., 77 illus. in color.  |b online resource. 
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490 1 |a NanoScience and Technology,  |x 2197-7127 
505 0 |a Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy. 
520 |a Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. 
650 0 |a Microtechnology. 
650 0 |a Microelectromechanical systems. 
650 0 |a Spectrum analysis. 
650 0 |a Mechanics, Applied. 
650 0 |a Nanotechnology. 
650 0 |a Engineering. 
650 0 |a Condensed matter. 
650 1 4 |a Microsystems and MEMS. 
650 2 4 |a Spectroscopy. 
650 2 4 |a Engineering Mechanics. 
650 2 4 |a Nanotechnology. 
650 2 4 |a Technology and Engineering. 
650 2 4 |a Condensed Matter Physics. 
700 1 |a Morita, Seizo.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Giessibl, Franz J.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Wiesendanger, Roland.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
710 2 |a SpringerLink (Online service) 
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950 |a Chemistry and Material Science (R0) (SpringerNature-43709) 

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