Cita APA (7a ed.)

Rein, S. (2005). Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (1st ed. 2005.). Springer Berlin Heidelberg : Imprint: Springer.

Cita Chicago Style (17a ed.)

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. 1st ed. 2005. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2005.

Cita MLA (8a ed.)

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. 1st ed. 2005. Springer Berlin Heidelberg : Imprint: Springer, 2005.