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Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. Th...
| Call Number: | Libro Electrónico |
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| Main Author: | |
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2005.
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| Edition: | 1st ed. 2005. |
| Series: | Springer Series in Materials Science,
85 |
| Subjects: | |
| Online Access: | Texto Completo |