APA (7th ed.) Citation

Rein, S. (2005). Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (1st ed. 2005.). Springer Berlin Heidelberg : Imprint: Springer.

Chicago Style (17th ed.) Citation

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. 1st ed. 2005. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2005.

MLA (8th ed.) Citation

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. 1st ed. 2005. Springer Berlin Heidelberg : Imprint: Springer, 2005.