Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques /

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...

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Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: SpringerLink (Online service)
Autres auteurs: Bhushan, Bharat (Éditeur intellectuel), Fuchs, Harald (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Édition:1st ed. 2006.
Collection:NanoScience and Technology,
Sujets:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Surfaces (Physics).
Nanotechnology.
Surfaces (Technology).
Thin films.
Polymers.
Microsystems and MEMS.
Spectroscopy.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
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