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Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Vogt, Thomas (Editor ), Dahmen, Wolfgang (Editor ), Binev, Peter (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Nanostructure Science and Technology,
Temas:
Acceso en línea:Texto Completo

MARC

LEADER 00000nam a22000005i 4500
001 978-1-4614-2191-7
003 DE-He213
005 20220120225241.0
007 cr nn 008mamaa
008 120301s2012 xxu| s |||| 0|eng d
020 |a 9781461421917  |9 978-1-4614-2191-7 
024 7 |a 10.1007/978-1-4614-2191-7  |2 doi 
050 4 |a TA418.5-.84 
072 7 |a TGMT  |2 bicssc 
072 7 |a TEC021000  |2 bisacsh 
072 7 |a TGMT  |2 thema 
082 0 4 |a 620.112  |2 23 
245 1 0 |a Modeling Nanoscale Imaging in Electron Microscopy  |h [electronic resource] /  |c edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev. 
250 |a 1st ed. 2012. 
264 1 |a New York, NY :  |b Springer New York :  |b Imprint: Springer,  |c 2012. 
300 |a IX, 182 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Nanostructure Science and Technology,  |x 2197-7976 
505 0 |a Statistical and Information-Theoretic Analysis of Resolution in Imaging -- (Scanning) Transmission Electron Microscopy: Overview and Examples for the Non-Microscopist -- Seeing Atoms in the Crossroads of Microscopy and Mathematics -- Kantianism at the Nanoscale -- Reference free cryo-EM algorithms using self-consistent data fusion -- Reference free cryo-EM algorithms using self-consistent data fusion -- Applications of multivariate statistical analysis for large-scale spectrum-image datasets and atomic-resolution images -- Compressed Sensing -- Imaging the behavior of atoms, clusters and nanoparticles during elevated temperature experiments in an aberration-corrected electron microscope -- Towards Quantitative Imaging using Aberration Correction and Exit Wave Reconstruction -- Image registration, classification and averaging in cryo-electron tomography -- (Scanning) Transmission Electron Microscopy with High spatial, temporal and energy resolution -- Fluctuation Microscopy: Nanoscale Order in Amorphous Materials from Electron Nanodiffraction -- Information in super-resolution microscopy and automated analysis of large-scale calcium imaging data -- Concluding remarks on Imaging in Electron Microscopy. 
520 |a Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing. 
650 0 |a Materials-Analysis. 
650 0 |a Analytical chemistry. 
650 0 |a Nanotechnology. 
650 0 |a Chemistry, Physical and theoretical. 
650 0 |a Measurement. 
650 0 |a Measuring instruments. 
650 1 4 |a Characterization and Analytical Technique. 
650 2 4 |a Analytical Chemistry. 
650 2 4 |a Nanotechnology. 
650 2 4 |a Theoretical Chemistry. 
650 2 4 |a Measurement Science and Instrumentation. 
700 1 |a Vogt, Thomas.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Dahmen, Wolfgang.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Binev, Peter.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9781461421900 
776 0 8 |i Printed edition:  |z 9781489997289 
776 0 8 |i Printed edition:  |z 9781461421924 
830 0 |a Nanostructure Science and Technology,  |x 2197-7976 
856 4 0 |u https://doi.uam.elogim.com/10.1007/978-1-4614-2191-7  |z Texto Completo 
912 |a ZDB-2-CMS 
912 |a ZDB-2-SXC 
950 |a Chemistry and Materials Science (SpringerNature-11644) 
950 |a Chemistry and Material Science (R0) (SpringerNature-43709)