Modeling Nanoscale Imaging in Electron Microscopy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission...

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Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: SpringerLink (Online service)
Autres auteurs: Vogt, Thomas (Éditeur intellectuel), Dahmen, Wolfgang (Éditeur intellectuel), Binev, Peter (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: New York, NY : Springer New York : Imprint: Springer, 2012.
Édition:1st ed. 2012.
Collection:Nanostructure Science and Technology,
Sujets:
Materials-Analysis.
Analytical chemistry.
Nanotechnology.
Chemistry, Physical and theoretical.
Measurement.
Measuring instruments.
Characterization and Analytical Technique.
Analytical Chemistry.
Theoretical Chemistry.
Measurement Science and Instrumentation.
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