Built-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computin...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Bou-Sleiman, Sleiman (Author), Ismail, Mohammed (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer New York : Imprint: Springer, 2012.
Edition:1st ed. 2012.
Series:SpringerBriefs in Electrical and Computer Engineering,
Subjects:
Electronic circuits.
Signal processing.
Electronic Circuits and Systems.
Signal, Speech and Image Processing .
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