Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /

The fifteenth international conference on Microscopy of Semiconducting Materials took place in Cambridge, UK on 2-5 April 2007. It was organised by the Institute of Physics, with co-sponsorship by the Royal Microscopical Society and endorsement by the Materials Research Society. The conference focus...

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Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: SpringerLink (Online service)
Autres auteurs: Cullis, A.G (Éditeur intellectuel), Midgley, P.A (Éditeur intellectuel)
Format: Électronique eBook
Langue:Inglés
Publié: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Édition:1st ed. 2008.
Collection:Springer Proceedings in Physics, 120
Sujets:
Materials science.
Condensed matter.
Spectrum analysis.
Measurement.
Measuring instruments.
Electronics.
Materials Science.
Condensed Matter Physics.
Spectroscopy.
Measurement Science and Instrumentation.
Electronics and Microelectronics, Instrumentation.
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