Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and...

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Détails bibliographiques
Cote:Libro Electrónico
Auteurs principaux: Foster, Adam (Auteur), Hofer, Werner A. (Auteur)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:Inglés
Publié: New York, NY : Springer New York : Imprint: Springer, 2006.
Édition:1st ed. 2006.
Collection:NanoScience and Technology,
Sujets:
Materials-Analysis.
Nanotechnology.
Surfaces (Technology).
Thin films.
Atomic structure  .
Molecular structure .
Condensed matter.
Spectrum analysis.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Atomic and Molecular Structure and Properties.
Condensed Matter Physics.
Spectroscopy.
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