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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...
| Call Number: | Libro Electrónico |
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| Main Author: | |
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
New York, NY :
Springer US : Imprint: Springer,
2005.
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| Edition: | 1st ed. 2005. |
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| Online Access: | Texto Completo |